XR-100SDD Silicon Drift Detector (SDD)

Amptek recently brought silicon wafer manufacturing in-house and improved the process. The result is a detector with lower noise, lower leakage current, better charge collection, and uniformity from detector to detector.

The XR-100SDD is a thermoelectrically cooled solid-state silicon drift detector (SDD) and preamplifier.  It is recommended for applications requiring the best energy resolution, very high count rates, and lowest X-ray energies.  Its performance, small size, and low cost make it the ideal detector for many laboratory and OEM X-ray spectroscopy applications, including EDS and XRF.


The XR-100SDD can provide a resolution of 125 eV FWHM at the Mn Kα line (electronic noise of 4.5 electrons rms), a peak to background of 20,000:1, an output count rate over 500 kcps, and can detect X-rays down to the Be Kα line (110 eV).  It has a 25 mm2active area and is 500 μm thick.

The standard XR-100SDD has a 0.5 mil Be window for good efficiency above 2 keV. For lower energies, the optional Patented C-Series windows available with our FAST SDD®provide good efficiency down to the B line.   For count rates >200 kcps, the FAST SDD®is recommended.

In the XR-100SDD, the detector is mounted on an extender (several different lengths are available), with the preamplifier in the attached metal box. It requires a separate signal processor and power supplies; Amptek’s PX5 is recommended and is ideally suited for most laboratory uses. The same SDD detectors are available in the smaller X-123SDDpackage or with smaller preamplifiers for OEMs and custom systems.


  • 125 eV FWHM Resolution @ 5.9 keV
  • High Peak-to-Background Ratio – 20,000:1
  • 25 mm2 – collimated to 17 mm2
  • 500 µm Thick
  • 2-Stage Thermoelectric Cooler
  • Cooling ΔT>85 K
  • Temperature Monitor
  • Thin Beryllium 0.3 or 0.5 mil
    Patented C-Series windows available with FAST SDD
  • Multilayer Collimator
  • Hermetic Package (TO-8)
  • Wide Detection Range
  • Easy to Operate
  • Radiation Hard


  • X-Ray Fluorescence
    • RoHS/WEEE
    • Precious metals
    • Alloy analysis
    • Light elements
  • EDS
  • Teaching and Research
  • Process Control
  • Mössbauer Spectrometers
  • PIXE
  • Wavelength dispersive XRF